Open the Youtube video In a quiet lab at Argonne National Laboratory, Saw-Wai Hla and his team were huddled around their ...

A further development in atomic force microscopy now makes it possible to simultaneously image the height profile of nanometer-fine structures as well as the electric current and the frictional force ...

Atomic force microscopy is a powerful technique that has been widely used in materials research, nano-imaging, and bioimaging. It is a topographical metrology approach that is commonly utilized in ...

A new microscopy technique allows scientists to see single-atom-thick boron nitride by making it glow under infrared light.

Atomic force microscopy (AFM) is a method of topographical measurement, wherein a fine probe is raster scanned over a material, and the minute variation in probe height is interpreted by laser ...

Graphene is now the most well-known 2D material. It is comprised of a sheet of covalently bonded carbon atoms arranged in a hexagonal lattice where the thickness has been broken down to a single atom.

Researchers have discovered how to design and place single-photon sources at the atomic scale inside ultrathin 2D materials, ...

A new AI model generates realistic synthetic microscope images of atoms, providing scientists with reliable training data to accelerate materials research and atomic scale analysis. (Nanowerk ...

Invented 30 years ago, the atomic force microscope has been a major driver of nanotechnology, ranging from atomic-scale imaging to its latest applications in manipulating individual molecules, ...

“Materials scientists designing a polymer-based material for a specific application must analyze how and why all these factors come together to impact the final product. Understanding the structure ...