High Resolution TEM (HRTEM) to identify lattice spacings less than 0.15 nm Crystallographic phase analysis in Diffraction mode: Selected Area Electron Diffraction (SAD) from a minimum area of 200 nm ...

a) TEM image showing three colliding clusters. The scale bar is 10 nm. b) Relative positions of molecules derived from the X-ray diffraction crystal structure are overlaid (brown) on the TEM image.

It is a multipurpose ultrahigh resolution analytical electron microscope with a wide range of capabilities such as high-resolution image observation, nanoarea X-ray analysis, versatile analysis by ...

The key principles behind electron diffraction are: SAED is a technique used in transmission electron microscopy (TEM) to obtain diffraction patterns from specific regions of a sample. A selected area ...

single-tilt liquid nitrogen holder purpose-built for the frost-free transfer of samples at liquid nitrogen temperature into a transmission electron microscope (TEM). Its primary application lies ...

The "TEM Center" software condenses STEM operation ... It uses an advanced sCMOS sensor to capture images and diffraction patterns. The JEM-2100 Plus has a goniometer stage of great stability ...

It is a multipurpose ultrahigh resolution analytical electron microscope with a wide range of capabilities such as high-resolution image observation, nanoarea X-ray analysis, versatile analysis by ...

For convenience, the “TEM Center” software exhibits STEM operation ... the “Matataki Flash” camera with an advanced sCMOS sensor to obtain images and diffraction patterns. The JEM-2100 Plus has a ...