The FEI 200kV Titan Themis Scanning Transmission Electron Microscope offers several key capabilities; conventional TEM mode (CTEM), Scanning TEM mode (STEM), Energy Filter TEM (EFTEM), Electron Energy ...

This course covers some of the more advanced topics in electron microscopy. The primary focus will be on imaging theory (relevant to HREM and STEM) and dynamical diffraction, the later focusing on the ...

CBED is another TEM-based technique that uses a convergent electron beam to probe even smaller regions of the sample, down to a few nanometers in size. The convergent beam produces a series of ...

The research team identified the degradation mechanism occurring between the air electrode and electrolyte of the electrolysis cell through TEM diffraction analysis and theoretical calculations.

It provides bright or dark field morphology images, and the corresponding crystal structures by electron diffraction. Contact and Location Contact: Yueling Qin, PhD Research Assistant Professor; Sr.

For example, diffraction patterns in TEM can be used to obtain exact measurements of local electromagnetic fields and details of a sample’s crystalline structure and defects (similar to EBSD maps on ...

Robert: Technically, switching any TEM to “diffraction mode” might seem as simple as pressing a single button. However, this apparent ease is misleading.

a) TEM image showing three colliding clusters. The scale bar is 10 nm. b) Relative positions of molecules derived from the X-ray diffraction crystal structure are overlaid (brown) on the TEM image.

To obtain these images the researchers used TEM and diffraction-filtered imaging to show the location, orientation and boundaries of hundreds of graphene grains. Their findings confirmed that grain ...

It is a multipurpose ultrahigh resolution analytical electron microscope with a wide range of capabilities such as high-resolution image observation, nanoarea X-ray analysis, versatile analysis by ...