a) TEM image showing three colliding clusters. The scale bar is 10 nm. b) Relative positions of molecules derived from the X-ray diffraction crystal structure are overlaid (brown) on the TEM image.

TEM is ideal for studying the morphology, crystal structure, and defects of materials. It is highly valued for its ability to provide detailed images of the internal structure of samples. Both STEM ...

One way to characterize defects in SiC crystal lattices is through STEM imaging, which requires the preparation of a TEM ...