Auger Electron Spectroscopy (AES) and X-ray Photoelectron Spectroscopy (XPS) are both essential for analyzing material surfaces, offering insights into elemental compositions and chemical states. Both ...

This article discusses how to remove auger peak and core line overlap using differing photon energies. Skip to ... Emission of the Auger electron can occur following an internal rearrangement of an ...

However, with the advent of nanotechnology, the interest in spatially-resolved elemental information has been raised. In this regard, Auger electron spectroscopy can be easily turned to microscopy, ...

Auger Electron Spectroscopy (AES) is a popular analytical technique utilized extensively in materials science and microelectronics, especially in the semiconductor industry.

Feb 15, 2024: Unlocking the full potential of Auger electron spectroscopy (Nanowerk News) A new computational approach makes more realistic assumptions about the redistribution of energy during the ...

The Perkin Elmer PHI-660 scanning Auger microprobe can be used for the compositional analysis of specimen surfaces using Auger electron spectroscopy (AES). The probe depth of AES is on the order of ...

Overview. The PHI 5800 X-ray photoelectron spectrometer (XPS) is equipped with a dual source anode (Al and Mg), a hemispherical analyzer for XPS and Auger electron spectroscopy (AES) analysis, ...

They plotted detected photoionization energies against the Auger electron energies. This showed a clear elliptical pattern, which the researchers then used to reconstruct the phase delays – and from ...