What Is Atomic Force Microscopy? Atomic force microscopy (AFM) is a powerful technique that enables surface ultrastructure visualization at molecular resolution. 1 Besides three-dimensional (3D) ...

Nanomaterials are used in various fields due to their distinct size-dependent properties, and accurate characterization is essential to optimize and design them for specific applications. 1 For ...

Vitamin C tablets’ surface roughness is key to defining their surface morphology and, therefore, their delivery rate and interaction time with external stimuli. Surface roughness can be observed via ...

Scientists at the Department of Energy's Oak Ridge National Laboratory have reimagined the capabilities of atomic force microscopy, or AFM, transforming it from a tool for imaging nanoscale features ...

For smartphones and computers to become smaller and faster, technologies capable of precisely controlling electrical properties at the nanoscale—beyond what is visible to the naked eye—are essential.

Within cells lies an intricate, microscopic world that remains invisible to the human eye. To visualize cellular details, scientists rely on the power of electron microscopes. With unparalleled ...

In the world of nanotechnology, where structures are measured in billionths of a meter, precise imaging and measurement techniques are essential. Critical Dimension Scanning Electron Microscopy ...

Attending the RAISe+ Scheme Signing Ceremony are Professor Chen Fu-Rong (2nd left) and his research team members: Professor Hsueh Yu-Chun (1st left), Dr Chen Yan (2nd right) and Mr Chen Yuchi (1st ...

Using scanning electron microscopy (SEM) and transmission electron microscopy (TEM), the researchers have been able to show how the electrode degrades during use, when performing a standardised stress ...

A home machinist and microscopy enthusiast has documented a detailed technical conversion of a scanning electron microscope (SEM) into a transmission electron microscope (TEM), demonstrating that ...

Although both a SEM and a TEM are electron microscopes, their working principles and images are very different. Whereas an SEM uses secondary electrons ejected after bombarding a sample’s surface with ...