The change in the spacing of the diffraction features with a change in voltage may be easily observed. It is necessary to adjust the position of the electron beam as the voltage is varied. It is ...

resulting in high-contrast images of weakly scattering objects. However, traditional dark-field microscopy is limited by the ...

If users wish to execute non-destructive mapping of grain morphology in 3D to describe materials like metals, ceramics or alloys, they can find out the first commercially available laboratory-based ...

However, the most important point is the need to limit the influence of diffraction contrast to obtain accurate measurements. In this respect, the use of a plane electron wave for EH is clearly ...

IOP Conference Series: Materials Science and Engineering, Advances in electron channelling contrast imaging and electron backscatter diffraction for imaging and analysis of structural defects in the ...

Schematic illustration of CrystalCT projection geometry. CrystalCT delivers dual modalities: absorption contrast tomography (ACT) and diffraction contrast tomography (DCT). Image Credit: Carl Zeiss ...