and α-Al 2 O 3 (5 wt.%), characterized by X-ray diffraction (XRD) and scanning electron microscopy (SEM) before sintering.

This work investigates reactive DC magnetron sputtering of NbN on GaN, β-Ga2O3, and Al2O3 substrates with a focus on GaN ... films exhibited a high intensity distinct x-ray diffraction (XRD) peak, a ...